Machine Learning Topics
A curated path from foundational regression models to advanced unsupervised learning. Each topic includes core concepts, sample implementation, and a link to the full notebook.
Simple Linear Regression
Implemented basic linear regression to understand the relationship between a single independent variable and a dependent variable. Focused on cost function minimization, model evaluation (MSE, R²), and visualization of the regression line.
Multiple Linear Regression
Extended linear regression to handle multiple features. Included feature scaling, multicollinearity check, and model interpretation using coefficients.
Gradient Descent from Scratch
Implemented Linear Regression using Gradient Descent algorithm manually to deeply understand optimization process and learning rate effects.
Classification Basics
Built foundational classification models. Covered binary & multiclass classification, confusion matrix, precision, recall, and F1-score.
Naive Bayes
Implemented Gaussian and Multinomial Naive Bayes for fast probabilistic classification. Excellent for text and high-dimensional data.
Support Vector Machine (SVM)
Used SVM with different kernels (linear, rbf, poly) for both classification and regression. Focused on hyperplane maximization and soft margin.
Decision Tree
Built interpretable decision trees with pruning techniques (max_depth, min_samples_split) and visualized the tree structure.
Random Forest
Implemented bagging techniques and compared feature importance analysis using the Random Forest classifier.
Ensemble Learning
Implementation of advanced ensemble techniques including Voting, Bagging, and Boosting to improve model accuracy and robustness.
Dimensionality Reduction (PCA)
Applied Principal Component Analysis for feature reduction, visualization, and improving model performance.
K-Means Clustering
Unsupervised clustering using K-Means with elbow method and silhouette score for optimal cluster selection.
DBSCAN Clustering
Density-based clustering for discovering clusters of arbitrary shape and detecting outliers.